22 Live Notices for 电子显微镜招标
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Market Research - Combined Pump System Sip And Neg For Jeol Transmission Electron Microscope
Delivery, Assembly And Start-Up Of A 3D Measurement Microscope System With Accessories
Provision Of Field Emission Low Vacuum Or Variable Pressure Scanning Electron Microscope With Energy Dispersive X-Ray Analyser
Supply And Installation Of A Cold Feg Corrected Scanning Transmission Electron Microscope (Stem) For The Carlos Iii University Of Madrid Within The Framework Of The Recovery, Transformation And Resilience Plan – Funded By The European Union – Nextgenerationeu
Procedura Aperta Sopra Soglia Comunitaria Ai Sensi Dell’Art. 71 Del D. Lgs. N. 36/2023 Per L’Affidamento Della Fornitura Di Un Microscopio Elettronico A Scansione Sem Ad Alta Risoluzione Con Sorgente Di Emissione Di Campo Di Tipo Schottky Termoassistita
The Purpose Of The Contract Is The Acquisition Of Scientific Equipment For High Schools In Burgundy-Franche-Comté. Reference: 2024-02F17-001
The Purpose Of The Contract Is The Acquisition Of Scientific Equipment For High Schools In Burgundy-Franche-Comté. Reference: 2024-02F17-001
Exploratory Notice To Verify The Uniqueness Of The Supplier For Assignment Pursuant To Art. 77 And Annex Ii.1 Of The Legislative Decree. N.36/2023
Supply Of A Transmission Electron Microscope
Fast 3D Sr Confocal Microscope
Notice Of Exploratory Market Investigation For The Acquisition Of A “Cutting-Edge Cryoem System, Integrated With Advanced Instrumentation For The Preparation And Characterization Of Samples”
Market Exploratory Survey Notice For The Acquisition Of A “Cutting-Edge Cryoem System, Integrated With Advanced Instrumentation For Sample Preparation And Characterization”
Transmission Electron Microscope
Transmission Electron Microscope
A Nanofabrication System Combining Electron Microscopy And Ion Beam Machining With The Possibility Of In-Situ Metal Deposition
Field Emitter Scanning Electrode Microscope (Copy)
Autoemission Scanning Electron Microscope
Notice Of Preliminary Market Consultation For The Award Of The Supply Of A Transmission Electron Microscope (Tem) With 120Kv Edx. Cup B87H23000330002
A Nanofabrication System Combining Electron Microscopy And Ion Beam Machining With The Possibility Of In-Situ Metal Deposition
Supply And Installation Of A Very High Resolution Field Emission Scanning Electron Microscope (Fesem) Equipped With An Eds Microanalysis System