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Country - Germany
Summary - 200 Mm Wafer Prober Incl. Temperature Testing (Pr874550)
Deadline - Mar 06, 2025
GT reference number - 102804041
Product classification - Electronic meters
Address - Germany
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 102804041
Document Type - Tender Notices
Description - Description: Description: 1 piece.This specification describes the requirements for a wafer probing system that is to be used for the characterization and test technology of sensor ICs at Fraunhofer IIS. The system must enable the handling of 200 mm and 300 mm wafers. The focus when using the machine is not on short handling times and high throughput, but on the accuracy of probing and the possibility of stimulating optical and magnetic sensors. A darkened DuT chamber is required for stimulating optical sensors. The wafer chuck must be made of non-magnetic metals to avoid distortion when characterizing magnetic field sensors.Options:2.1 Installation conditions AC voltage (preferred specifica
Gt Ref Id - 102804041
Deadline - Mar 06, 2025
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