Most trusted source for Tendering Opportunities and Business Intelligence since 2002

3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) (Pr876527-2690-P)

Name: 3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) (Pr876527-2690-P)
Start: 2025-04-28
End: 2025-05-27
Location: Einkauf Betrieb und Infrastruktur

Einkauf Betrieb und Infrastruktur Germany has Released a tender for 3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) (Pr876527-2690-P) in laboratory equipment and services . The tender was released on Apr 28, 2025.

Country - Germany

Summary - 3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) (Pr876527-2690-P)

Deadline - May 27, 2025

GT reference number - 107747474

Product classification - Scanning electron microscopes

Organization Details:

Address - Germany

Contact details - 565656565

Tender notice no. - 76454545

GT Ref Id - 107747474

Document Type - Tender Notices

Notice Details and Documents:

Description - notice_title: 3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) (Pr876527-2690-P)local title:: 3D LIT-OBIRCH system (IMWS-2.1) +Scanning Electron Microscope with ultrafast e-beam operation (IMWS -3.1 ) (PR876527-2690-P)Contract Type: : Service

Gt Ref Id - 107747474

Deadline - May 27, 2025

View more tenders for

Scanning electron microscopes Tenders Germany Tenders

Similar Tenders :

Summary:

3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) (Pr876527-2690-P)

Summary:

Precise Ion Beam Based Trenching Tool (Imws-03.2) + High Performance Ga-Fib Sample Preparation (Imws-08.1) + High Performance Analyical Sem Inspection (Imws-08.2) (Pr924050-2690-P)

Summary:

Open Procedure Above Community Threshold Pursuant To Art. 71 Of Legislative Decree N. 36/2023 For The Assignment Of The Supply, Installation And Putting In Function Of A Focused Ionic Bundle Microscope (Fib) Combined With An Electronic Microscope With Scanning (Sem) For The Preparation Of Samples For Electronic Microscopy As Part Of The Pnrr M4 C2 Investment 3.1 Idrastra@Enl Project

Summary:

Supply Of N. 2 Scientific Equipment With High Technological Content For The Preparation Of The L1 Laboratory Of The Project Departments Of Excellence 2023-2027

Summary:

Raster Electron Microscope

Create Account

Join to access thousands of business opportunities

Quick Links

Why Us

3,00,000 +

Users

190 +

Countries Covered

5,00,000 +

Agencies Tracked

50,000 +

Notices Daily

90 Million +

Database