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Automated Inspection Microscope For 300 Mm Silicon Substrates And Tooling

National Research Council Canada Canada has Released a tender for Automated Inspection Microscope For 300 Mm Silicon Substrates And Tooling in GIS/ GPS. The tender was released on Feb 26, 2025.

Country - Canada

Summary - Automated Inspection Microscope For 300 Mm Silicon Substrates And Tooling

Deadline - Mar 12, 2025

GT reference number - 104001093

Product classification - Measuring instruments

Organization Details:

  Address - Canada

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 104001093

  Document Type - Tender Notices

Notice Details and Documents:

Description - Description: The National Research Council of Canada has a requirement for an automated optical microscope, dedicated to the inspection of microstructured silicon wafers up to 300 mm in diameter, either on their own or mounted in support custom tools . The key requirements for this system are a design with wide clearance on three sides, enabling large parts to be handled, and DIN EN ISO 14644-1 certification (ISO5 class cleanroom).local title:: Automated inspection microscope for 300 mm silicon substrates and toolingContract Duration: : 4 month(s)Contract Type: : Supplylocal description: : The National Research Council of Canada has a requirement for an automated optical microscope, dedicated

Gt Ref Id - 104001093

Deadline - Mar 12, 2025

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