Automated Inspection Microscope For 300 Mm Silicon Substrates And Tools

Name: Automated Inspection Microscope For 300 Mm Silicon Substrates And Tools
Start: 2025-04-04
End: -0001-11-30
Location: Conseil national de recherches du Canada

Conseil national de recherches du Canada Canada has Released a tender for Automated Inspection Microscope For 300 Mm Silicon Substrates And Tools in GIS/ GPS. The tender was released on Apr 04, 2025.

Country - Canada

Summary - Automated Inspection Microscope For 300 Mm Silicon Substrates And Tools

Deadline - login to view

GT reference number - 106320497

Product classification - Measuring instruments

Organization Details:

Address - Canada

Contact details - 565656565

Tender notice no. - 76454545

GT Ref Id - 106320497

Document Type - Tender Notices

Notice Details and Documents:

Description - notice_title: Automated Inspection Microscope For 300 Mm Silicon Substrates And Toolslocal title:: Microscope d'inspection automatisé pour substrats de silicium 300 mm et outillageContract Duration: : La durée du contrat sera de 2 moisContract Type : : Supply tender_contract_end_date: 2025-06-30 00:00:00 tender_contract_start_date: 2025-04-02 00:00:00 lot_details: 1: Automated inspection microscope for 300 mm silicon substrates and tools

Gt Ref Id - 106320497

Deadline - Nov 30, -0001

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