Automatic Wafer Probers

  Address - Belgium

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 104348571

  Document Type - Tender Notices

Description - Description: In combination with measuring instruments, Auto (Frame) Probers are used for parametric testing of individual integrated circuits at wafer or sample level. The device should be suitable at least for testing micrometer-thin (a few hundred ) to millimetre-thick samples or wafers of 200 mm and 300 mm diameter and for probing dies on wafer frames (for 300 mm wafers on dicing frames).local title:: Automatic Wafer ProbersContract Duration: : 4 YEARContract Type: : Supplylocal description: : In combination with measuring instruments, Auto (Frame) Probers are used for parametric testing of individual integrated circuits at wafer or sample level. The device should be suitable at least for

Gt Ref Id - 104348571

Deadline - Mar 19, 2025