Delivery Of A Dynamic Secondary Ion Mass Spectrometer.

  Address - Poland

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 97925673

  Document Type - Tender Notices

Description - Description: The subject of the order is the delivery and commissioning of a Secondary Ion Mass Spectrometer (SIMS) designed for the characterization of obtained substrate crystals and implanted GaN substrates in terms of the content of intentionally introduced dopants and unintentional impurities. The device must ensure the performance of precise elemental and isotopic analyses in nitride semiconductors, such as doped and implanted crystals. The device must enable depth profiling with high resolution and a wide dynamic range, and also offer excellent detection limits thanks to two high-density ion sources (O2+ and Cs+). The spectrometer must be equipped with an automatic sample loading syst

Gt Ref Id - 97925673

Deadline - Nov 22, 2024