Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Country - Switzerland
Summary - Focused Ion Beam Scanning Electron Microscope
Deadline - login to view
GT reference number - 83330298
Product classification - Scanning electron microscopes
Address - Switzerland
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 83330298
Document Type - Tender Notices
Description - Description: Powerful two-beam device comprising a field emission scanning electron microscope and a focused ion (gallium) beam. Can be used for a wide range of sample preparation and characterization at the micrometer and nanometer scale. (For more details see Specification Documentation).local title:: Microscope électronique à balayage à faisceau d'ions focalisétype_of_procedure: Open
Gt Ref Id - 83330298
Deadline - Jul 23, 2024
Similar Tenders :
Join to access thousands of business opportunities
Why Us
3,00,000 +
Users
190 +
Countries Covered
5,00,000 +
Agencies Tracked
50,000 +
Notices Daily
90 Million +
Database
