Mapping Ellipsometer

  Address - Czech Republic

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 19220334

  Document Type - Tender Notices

Description - Description: The subject of this public order is the supply of a mapping ellipsometer with the capability of mapping, automatic sample adjustment and simple analysis for measuring structures on deposited/etched surfaces with high resolution. On the l ayers of the selected materials, the device measures the thickness map, in the case of a known substrate, the thickness of the highest layer from the multilayer. The purpose of the device is to create a detailed map of layer thicknesses in the lithography process. The speed of mapping (it takes place point by point) and the ease of processing the results are important. The sample must be adjusted automatically at each measured point. The device w

Gt Ref Id - 19220334

Deadline - Aug 22, 2024