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Country - Italy
Summary - Open Procedure Above Community Threshold Pursuant To Art. 71 Of Legislative Decree N. 36/2023 For The Assignment Of The Supply, Installation And Putting In Function Of A Focused Ionic Bundle Microscope (Fib) Combined With An Electronic Microscope With Scanning (Sem) For The Preparation Of Samples For Electronic Microscopy As Part Of The Pnrr M4 C2 Investment 3.1 Idrastra@Enl Project
Deadline - May 26, 2025
GT reference number - 107497211
Product classification - Scanning electron microscopes
Address - Italy
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 107497211
Document Type - Tender Notices
Description - Description: Focused ionic bundle microscope (FIB) combined with an electronic scan electronic microscope (SEM), below indicated as FIB-Sem microscope, to carry out the following main activities:- observation with nanometric resolution of micro and n anostructures through images of secondary electrons, retrodic and transmitted;- Complete realization and also assisted by software of thin preparations (lamellae) for analyzes with Temp microscopy, including the deposition of protective layers from gaseous precursors, erosion and thinning via focused ionic bundle, the transfer by micromanipulation;- morphological and compositional analysis of structures of interest with submicrometric resolution;
Gt Ref Id - 107497211
Deadline - May 26, 2025
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