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Probe Aberration Correction Atomic Resolution Analysis Cold Cathode Field Emission Scanning Transmission Electron Microscope System Set

Name: Probe Aberration Correction Atomic Resolution Analysis Cold Cathode Field Emission Scanning Transmission Electron Microscope System Set
Start: 2025-04-28
End: 2025-05-13
Location: 国立大学法人

国立大学法人 Japan has Released a tender for Probe Aberration Correction Atomic Resolution Analysis Cold Cathode Field Emission Scanning Transmission Electron Microscope System Set in laboratory equipment and services . The tender was released on Apr 28, 2025.

Country - Japan

Summary - Probe Aberration Correction Atomic Resolution Analysis Cold Cathode Field Emission Scanning Transmission Electron Microscope System Set

Deadline - May 13, 2025

GT reference number - 107781669

Product classification - Laboratory, optical and precision equipments (excl. glasses)

Organization Details:

Address - Japan

Contact details - 565656565

Tender notice no. - 76454545

GT Ref Id - 107781669

Document Type - Tender Notices

Notice Details and Documents:

Description - Description: Public notice regarding invitationsNow that the draft specifications for the procured items have been prepared as follows, we would like to invite opinions on the draft specifications.April 28, 2025Suzuki Noriko, Secretary General of Toy ama University National University Corporation◎Procurement agency number: 415 ◎Location number: 16○No. 51. Procurement details⑴ Item classification number 24⑵ Purchased items and quantities Probe aberration correction Atomic resolution analysis Cold cathode field emission scanning transmission electron microscope system set2. How to submit opinions⑴ Deadline for submitting opinions: May 30th, 2025, 5:00pm (must arrive if sent by mail)

Gt Ref Id - 107781669

Deadline - May 13, 2025