Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Country - Singapore
Summary - Provision Of One (1) Unit Of Overlay Metrology Tool With Full Wafer Map Optical Image Capability
Deadline - Dec 16, 2024
GT reference number - 97975701
Product classification - Laboratory, optical and precision equipments (excl. glasses)
Address - Singapore
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 97975701
Document Type - Tender Notices
Description - notice_title: Provision Of One (1) Unit Of Overlay Metrology Tool With Full Wafer Map Optical Image Capabilitylocal title:: Provision of One (1) Unit of Overlay Metrology Tool with Full Wafer Map Optical image capabilityContract Duration: : 6 Months category: laboratory equipment & supplies lot_details: 1: Provision of One (1) Unit of Overlay Metrology Tool with Full Wafer Map Optical image capability
Gt Ref Id - 97975701
Deadline - Dec 16, 2024
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