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Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Country - Switzerland
Summary - Scanning Electron And Focused Ion Beam Microscope (Fib-Sem)
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GT reference number - 83330297
Product classification - Scanning electron microscopes
Address - Switzerland
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 83330297
Document Type - Tender Notices
Description - Description: Powerful dual-beam device consisting of a focused ion beam (gallium) and a field emission scanning electron microscope. Can be used for a wide range of sample preparation and characterization in the micro and nano range. (For details see Specification Documentation).local title:: Rasterelektronen- und fokussierter Ionenstrahl-Mikroskop (FIB-SEM)type_of_procedure: Open
Gt Ref Id - 83330297
Deadline - Jul 23, 2024
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