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Scanning Electron And Focussed Ion Beam Microscope (Fib-Sem)

ETH Zurich Switzerland has Released a tender for Scanning Electron And Focussed Ion Beam Microscope (Fib-Sem) in laboratory equipment and services . The tender was released on Jun 28, 2024.

Country - Switzerland

Summary - Scanning Electron And Focussed Ion Beam Microscope (Fib-Sem)

Deadline - login to view

GT reference number - 83447967

Product classification - Scanning electron microscopes

Organization Details:

  Address - Switzerland

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 83447967

  Document Type - Tender Notices

Notice Details and Documents:

Description - Description: Scanning Electron And Focussed Ion Beam Microscope (Fib-Sem)local title:: Scanning electron and focussed ion beam microscope (FIB-SEM) Global Tenders is not only confined to tenders but we also upload crucial information, from future prospects to past market records.

Gt Ref Id - 83447967

Deadline - Jul 23, 2024

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