Scanning Electron Microscope

  Address - Finland

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 106263912

  Document Type - Tender Notices

Description - Description: Instrument to be purchased is a Scanning Electron Microscope (SEM) for 200 mm standard wafer compatibility. An automated measurement over entire wafer is required. Also, EDS detector and 3D metrology are required. The instrument shall in clude standard back scattered electrons and secondary electrons detectors as well as cathodoluminescence detector. The SEM to be purchased will replace our current LEO 1550 used since 1997.local title:: Scanning Electron MicroscopeContract Type: : Supplylocal description: : Instrument to be purchased is a Scanning Electron Microscope (SEM) for 200 mm standard wafer compatibility. An automated measurement over entire wafer is required. Also, EDS d

Gt Ref Id - 106263912

Deadline - May 02, 2025