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Set Of Rental And Modification Of Sic Wafer Quality Non-Destructive Inspection Equipment

国立研究開発法人産業技術総合研究所 Japan has Released a tender for Set Of Rental And Modification Of Sic Wafer Quality Non-Destructive Inspection Equipment in laboratory equipment and services . The tender was released on Feb 19, 2025.

Country - Japan

Summary - Set Of Rental And Modification Of Sic Wafer Quality Non-Destructive Inspection Equipment

Deadline - Mar 06, 2025

GT reference number - 103620057

Product classification - Laboratory, optical and precision equipments (excl. glasses)

Organization Details:

  Address - Japan

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 103620057

  Document Type - Tender Notices

Notice Details and Documents:

Description - Description: Publication of discretionary contractsThe following discretionary contracts are announced:February 19th, 2025Contracting positionNational Institute of Advanced Industrial Science and TechnologyYamano Masashi, Head of Large Procurement Of fice◎Procurement agency number: 808 ◎Location number: 08○Asian No. 3371. Procurement details⑴ Item classification number 24⑵ Purchasing subject and quantity: Rental and modification of SiC wafer quality non-destructive inspection equipment, set2. Estimated date for discretionary contract: March 11, 20253. Reason for the provisions of the "Government Procurement Agreement" to be made by discretionary contracts d "Compatibility"4. Name of

Gt Ref Id - 103620057

Deadline - Mar 06, 2025

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