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Country - Japan
Summary - Set Of Rental And Modification Of Sic Wafer Quality Non-Destructive Inspection Equipment
Deadline - Mar 06, 2025
GT reference number - 103620057
Product classification - Laboratory, optical and precision equipments (excl. glasses)
Address - Japan
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 103620057
Document Type - Tender Notices
Description - Description: Publication of discretionary contractsThe following discretionary contracts are announced:February 19th, 2025Contracting positionNational Institute of Advanced Industrial Science and TechnologyYamano Masashi, Head of Large Procurement Of fice◎Procurement agency number: 808 ◎Location number: 08○Asian No. 3371. Procurement details⑴ Item classification number 24⑵ Purchasing subject and quantity: Rental and modification of SiC wafer quality non-destructive inspection equipment, set2. Estimated date for discretionary contract: March 11, 20253. Reason for the provisions of the "Government Procurement Agreement" to be made by discretionary contracts d "Compatibility"4. Name of
Gt Ref Id - 103620057
Deadline - Mar 06, 2025
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