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Shanghai Automotive Chip Engineering Center Co., Ltd. Focused Ion Beam Scanning Electron Microscope - International Bidding Announcement (1)

Shanghai Automotive Chip Engineering Center Co., Ltd. China has Released a tender for Shanghai Automotive Chip Engineering Center Co., Ltd. Focused Ion Beam Scanning Electron Microscope - International Bidding Announcement (1) in laboratory equipment and services . The tender was released on Jul 12, 2024.

Country - China

Summary - Shanghai Automotive Chip Engineering Center Co., Ltd. Focused Ion Beam Scanning Electron Microscope - International Bidding Announcement (1)

Deadline - Aug 02, 2024

GT reference number - 18741518

Product classification - Laboratory, optical and precision equipments (excl. glasses)

Organization Details:

  Address - China

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 18741518

  Document Type - Tender Notices

Notice Details and Documents:

Description - Description: Shanghai Automotive Chip Engineering Center Co., Ltd. Focused Ion Beam Scanning Electron Microscope - International Bidding Announcement (1)local title:: 上海汽车芯片工程中心有限公司聚焦离子束扫描电子显微镜 - 际招标公告(1)

Gt Ref Id - 18741518

Deadline - Aug 02, 2024

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