Test Head With Test Cards And Manipulator (Pr876327-2440-P)

  Address - Germany

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 104068240

  Document Type - Tender Notices

Description - Description: Description: 1 pieceThis specification describes the requirements for a semiconductor test system that is to be used for the characterization and test of sensor ICs at Fraunhofer IIS. The system must have interfaces that enable a connect ion to a Wafer-Probing system and a pick-and-place handler. The system must be compatible in hardware and software to an existing Advantest V93000 test system in the Fraunhofer SocietyOptionsInstallation conditions AC voltage (preferred specification)Supply channels (High Power) Channel number expandable to at leastSupply channels (High Power) expandable voltage range per channel (continuous)Supply channels (High Power) expandable voltage range p

Gt Ref Id - 104068240

Deadline - Mar 27, 2025