Xenon Focused Ion Beam Electron Microscope

  Address - Czech Republic

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 101964656

  Document Type - Tender Notices

Description - Description: The subject of the public contract is a dual beam electron microscope with a xenon focused ion beam (dual beam) SEM/PFIB in an assembly according to technical specifications. The requested assembly also includes analytical equipment for the EDS, EBSD and SIMS methods. The SEM/PFIB microscope with all supporting equipment (hereinafter referred to as the “microscope”) is delivered in a configuration that guarantees full functionality of the unit and all its parts, i.e. all necessary auxiliary equipment is included in the delivery and their mutual cooperation is guaranteed. The microscope also includes sufficient safety measures to protect the microscope as a whole, its vacuum

Gt Ref Id - 101964656

Deadline - Feb 03, 2025